Carrier density and DC conductivity of ultrathin aluminum films

Journal of Materials Science

Volumn 39, Issue 8, 2004, Pages 2865-2867

  Du, Hao ^a,b   Gong, Jun ^a   Sun, Chao ^a   Lee, Soo Wohn ^b   Wen, Li Shi ^a  

^a INSTITUTE OF METAL RESEARCH   (China)

^b SunMoon University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; CARRIER CONCENTRATION; ELECTRIC CONDUCTIVITY; ELECTRONS; FILM GROWTH; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS;

DC CONDUCTIVITY; FILM THICKNESS; ULTRATHIN ALUMINUM FILMS;

ULTRATHIN FILMS;

EID: 2142647862     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/B:JMSC.0000021466.73734.b1     Document Type: Article

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