Temperature induced growth away from the (001) orientation in SrBi 2Ta 2O 9 films deposited by PLD

Journal of Materials Science

Volumn 39, Issue 8, 2004, Pages 2937-2940

  De La Paz Cruz Jauregui M A ^a   Portelles, J J ^b   Siqueiros, J M ^a  

^a UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

^b UNIVERSITY OF HAVANA   (Cuba)

Author keywords

[No Author keywords available]

Indexed keywords

POLYCRYSTALLINE GROWTH; PULSE REPETITION RATE (PRR); REMNANT POLARIZATION; TOPOGRAPHY;

ANNEALING; EXCIMER LASERS; FERROELECTRIC MATERIALS; FILM GROWTH; KRYPTON; MICROELECTRONICS; OXYGEN; PLATINUM; POLYCRYSTALLINE MATERIALS; PULSED LASER DEPOSITION; SCANNING ELECTRON MICROSCOPY; SILICA; TITANIUM DIOXIDE; X RAY DIFFRACTION ANALYSIS;

STRONTIUM COMPOUNDS;

EID: 2142639446     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/B:JMSC.0000021486.55054.10     Document Type: Article

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