Electromigration-induced grain rotation in anisotropic conducting beta tin

Applied Physics Letters

Volumn 86, Issue 24, 2005, Pages 1-3

  Wu, Albert T ^a   Gusak, A M ^a,c   Tu, K N ^a   Kao, C R ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b NATIONAL CENTRAL UNIVERSITY   (Taiwan)

^c CHERKASY NATIONAL UNIVERSITY   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

GRAIN ROTATION; LATTICE DIFFUSION; VACANCY FLUXES; X-RAY MICRODIFFRACTION;

ANISOTROPY; CRYSTALLIZATION; ELECTRON SCATTERING; GRAIN BOUNDARIES; LATTICE CONSTANTS; MATHEMATICAL MODELS; TIN;

ELECTROMIGRATION;

EID: 21344460702     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1941456     Document Type: Article

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