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Volumn 13, Issue 10, 2005, Pages 3802-3815

Characterization of photonic crystal microcavities with manufacture imperfections

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ELECTRIC FIELD EFFECTS; ERROR ANALYSIS; FINITE DIFFERENCE METHOD; PRINCIPAL COMPONENT ANALYSIS; TIME DOMAIN ANALYSIS;

EID: 21244468684     PISSN: 10944087     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OPEX.13.003802     Document Type: Article
Times cited : (7)

References (17)
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  • 4
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  • 5
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  • 8
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.