Bad pixel identification by means of principal components analysis

Optical Engineering

Volumn 41, Issue 9, 2002, Pages 2152-2157

  López Alonso, José Manuel ^a   Alda, Javier ^a  

^a UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

Author keywords

Bad pixels; Charge coupled devices; Data reduction; Noise; Thermal imagers

Indexed keywords

ALGORITHMS; CHARGE COUPLED DEVICES; DATA REDUCTION; EIGENVALUES AND EIGENFUNCTIONS; INFRARED IMAGING; PRINCIPAL COMPONENT ANALYSIS; SPURIOUS SIGNAL NOISE;

PIXEL IDENTIFICATION; THERMAL IMAGERS;

IMAGE QUALITY;

EID: 0036754065     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.1497397     Document Type: Article

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