메뉴 건너뛰기
IEEE Design and Test of Computers
Volumn 22, Issue 3, 2005, Pages 224-231
Value-added defect testing techniques
Author keywords

[No Author keywords available]
Indexed keywords

COMPUTER SIMULATION; CORRELATION METHODS; CRYSTAL DEFECTS; FAILURE ANALYSIS; PROBABILITY; SEMICONDUCTOR DEVICE TESTING; STATISTICAL METHODS;
EID: 21244464766     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/MDT.2005.74     Document Type: Article
Times cited : (14)
References (4)
  • 1
    • 21244461442 scopus 로고    scopus 로고
    • "Enhancing Manufacturing Test and Yield in the Nanometer Era"
    • Aug
    • R. Press and J. Ferguson, "Enhancing Manufacturing Test and Yield in the Nanometer Era," Semiconductor Manufacturing, vol. 5, no. 8, Aug. 2004, pp. 38-44.
    • (2004) Semiconductor Manufacturing , vol.5 , Issue.8 , pp. 38-44
    • Press, R.1    Ferguson, J.2
  • 2
    • 21244460679 scopus 로고    scopus 로고
    • "Rethinking Test at 130 Nanometers and Below"
    • 12 Sep.
    • S. Cook, "Rethinking Test at 130 Nanometers and Below," EE Times, 12 Sep. 2003; http://www.eetimes.com/news/design/ showArticle.jhtml?articlelD=17408660.
    • (2003) EE Times
    • Cook, S.1
  • 3
    • 0142039802 scopus 로고    scopus 로고
    • "High Frequency, At-Speed Scan Testing"
    • Sep.-Oct
    • X. Lin et al., "High Frequency, At-Speed Scan Testing," IEEE Design & Test of Computers, vol. 20, no 5, Sep.-Oct. 2003, pp 17-25.
    • (2003) IEEE Design & Test of Computers , vol.20 , Issue.5 , pp. 17-25
    • Lin, X.1
  • 4
    • 13244249525 scopus 로고    scopus 로고
    • "Compactor Independent Direct Diagnosis"
    • IEEE CS Press
    • W.-T. Cheng et al., "Compactor Independent Direct Diagnosis," Proc 13th Asian Test Symp. (ATS 04), IEEE CS Press, 2004, pp. 204-209.
    • (2004) Proc 13th Asian Test Symp (ATS 04) , pp. 204-209
    • Cheng, W.-T.1

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.