A model for the electrical degradation of metal microcontacts during many-cycle operation

Proceedings of the ASME/STLE International Joint Tribology Conference, IJTC 2004

Volumn , Issue PART A, 2004, Pages 37-39

  Mihailovich, R E ^a   Denatale, J F ^a  

^a ROCKWELL SCIENTIFIC COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; DEGRADATION; ELECTRIC LOADS; ELECTRIC SWITCHES; MATHEMATICAL MODELS; MICROELECTRONICS; NATURAL FREQUENCIES; SURFACE PHENOMENA;

ASPERITY-BASED DESCRIPTION; ELECTRICAL DEGRADATION; MANY-CYCLE OPERATION; METAL MICROCONTACTS;

MICROELECTROMECHANICAL DEVICES;

EID: 21244432008     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/trib2004-64337     Document Type: Conference Paper

References (7)

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