Characterizing single crystal surfaces using high resolution electron diffraction

Analytical and Bioanalytical Chemistry

Volumn 379, Issue 4, 2004, Pages 588-593

  Thien, D ^a   Meyer Zu Heringdorf, F J ^a   Kury, P ^a   Horn Von Hoegen, M ^a  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

Electron diffraction; Epitaxy; Reconstruction; Si(100); SPA LEED

Indexed keywords

DEPOSITION; EPITAXIAL GROWTH; LOW ENERGY ELECTRON DIFFRACTION; MORPHOLOGY; QUENCHING; REACTION KINETICS; SILICON; SURFACE CHEMISTRY;

RECONSTRUCTION; ROOM TEMPERATURE (RT); SI(111); SPA-LEED;

SINGLE CRYSTALS;

SILICON;

ARTICLE; CHEMISTRY; CRYSTALLIZATION; INSTRUMENTATION; MATERIALS TESTING; METHODOLOGY; SURFACE PROPERTY; TRANSMISSION ELECTRON MICROSCOPY;

CRYSTALLIZATION; MATERIALS TESTING; MICROSCOPY, ELECTRON, TRANSMISSION; SILICON; SURFACE PROPERTIES;

EID: 21144456311     PISSN: 16182642     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00216-004-2547-8     Document Type: Conference Paper

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