Effect of annealing on structural and magnetic properties of a thick (Ga,Mn)as layer

Chinese Physics Letters

Volumn 22, Issue 2, 2005, Pages 466-468

  Deng, Jia Jun ^a   Zhao, Jian Hua ^a   Jiang, Chun Ping ^a   Zhang, Yan ^b   Niu, Zhi Chuan ^a   Yang, Fu Hua ^a   Wu, Xiao Guang ^a   Zheng, Hou Zhi ^a  

^a INSTITUTE OF SEMICONDUCTORS   (China)

^b PEKING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; AUGER ELECTRON SPECTROSCOPY; LATTICE CONSTANTS; MAGNETIC PROPERTIES; X RAY DIFFRACTION;

AS LAYERS; AUGER-ELECTRON SPECTROSCOPY; DOUBLE CRYSTALS; EFFECT OF ANNEALING; FREE SURFACES; INTERSTITIALS; INVESTIGATE EFFECTS; POSTGROWTH ANNEALING; SPECTROSCOPY MEASUREMENTS; STRUCTURAL AND MAGNETIC PROPERTIES;

CURIE TEMPERATURE;

EID: 21144436479     PISSN: 0256307X     EISSN: None     Source Type: Journal    
DOI: 10.1088/0256-307X/22/2/055     Document Type: Article

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