Compton-scattering measurement of diagnostic x-ray spectrum using high-resolution Schottky CdTe detector

Medical Physics

Volumn 32, Issue 6, 2005, Pages 1542-1547

  Maeda, Koji ^a   Matsumoto, Masao ^b   Taniguchi, Akira ^c  

^a HIROSHIMA INTERNATIONAL UNIVERSITY   (Japan)

^b OSAKA UNIVERSITY GRADUATE SCHOOL OF MEDICINE   (Japan)

^c Toyo Medic Co Ltd   (Japan)

Author keywords

Compton scatter spectroscopy; Diagnostic x ray spectrum; High resolution Schottky CdTe detector; Monte Carlo simulation; Stripping procedure

Indexed keywords

CADMIUM TELLURIDE; COMPTON SCATTERING; COMPUTERIZED TOMOGRAPHY; II-VI SEMICONDUCTORS; IONIZATION; IONIZATION CHAMBERS; METAL DETECTORS; MONTE CARLO METHODS; PHOTONS; PILES; QUALITY ASSURANCE; QUALITY CONTROL; SPECTROSCOPY; X RAY RADIOGRAPHY; X RAY SPECTROGRAPHS; X RAYS;

CLINICAL CONDITIONS; COMPTON SCATTERED PHOTONS; DIAGNOSTIC X-RAY SPECTRUM; HIGH RESOLUTION SCHOTTKY CDTE DETECTOR; RADIOGRAPHIC SYSTEMS; SCATTERING MEASUREMENTS; SCHOTTKY CDTE DETECTORS; SPECTRAL MEASUREMENT;

X RAY DETECTORS;

ALUMINUM;

COMPTON EFFECT; CONFERENCE PAPER; DIAGNOSTIC IMAGING; FILTRATION; IONIZATION CHAMBER; MATHEMATICAL ANALYSIS; MEDICAL INSTRUMENTATION; PHOTON; PRIORITY JOURNAL; QUALITY CONTROL; RADIATION DETECTOR; ROENTGEN SPECTROSCOPY; X RAY ANALYSIS;

EID: 21144432095     PISSN: 00942405     EISSN: None     Source Type: Journal    
DOI: 10.1118/1.1921647     Document Type: Conference Paper

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