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note
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Although the series resistance in the equivalent circuit model shown in Fig. 1sbd is the resultant sum of all the resistances from the different sources, these effects can be separated from each other in a carefully designed experiment. For example, if the thickness of a semiconductor layer is varied while all the other conditions remain unchanged, the portion from the bulk resistivity of the material can be separated from the contact resistance, as demonstrated in Ref. 16. Resistances due to interconnections and probe lines may be assumed negligible if one uses a so-called four-wire connection scheme which is available in most of the source-measure units such as Keithley 2400 used in this study.
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24
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20944441339
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note
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Since Eq. s5d is good for an equivalent circuit model with a single diode, FF was calculated by finding the condition maximizing the product of V and JsVd in 0,V,VOC.
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25
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20944441123
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note
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This observation is in line with the study on the characteristics of a multilayer CuPc/C60 solar cell reported in Ref. 3. In that report, the similar pattern of results were obtained by fitting the "net photocurrent" de-fined by the difference in JsVd under illumination and in the dark. While this method is adequate as their cells have very small RSA, it can lead to an underestimation of photocurrent at 0,V,VOC when the effect of the RSA can no longer be ignored, as its influence on electrical characteristics is different between dark and illuminated conditions and moreover becomes more significant when the light intensity increases.
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