Measurement of the mean inner potential of ZnO nanorods by transmission electron holography

Applied Physics Letters

Volumn 86, Issue 15, 2005, Pages 1-3

  Muller E ^a   Kruse, P ^a   Gerthsen, D ^a   Schowalter, M ^b   Rosenauer, A ^b   Lamoen, D ^c   Kling, R ^d   Waag, A ^e  

^a UNIVERSITY OF KARLSRUHE   (Germany)

^b UNIVERSITY OF BREMEN   (Germany)

^c UNIVERSITY OF ANTWERP   (Belgium)

^d UNIVERSITY OF ULM   (Germany)

^e TECHNICAL UNIVERSITY OF BRAUNSCHWEIG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BINDING ENERGY; CALIBRATION; ELECTRON DIFFRACTION; ELECTRON HOLOGRAPHY; KINEMATICS; PHASE SHIFT; SEMICONDUCTOR LASERS; TRANSMISSION ELECTRON MICROSCOPY; ZINC OXIDE;

ELECTRON WAVES; NANORODS; TRANSMISSION ELECTRON HOLOGRAPHY; VICINITY;

NANOSTRUCTURED MATERIALS;

EID: 20844453714     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1901820     Document Type: Article

References (10)

1. M. O'Keefe and J. C. H. Spence, Acta Crystallogr., Sect. A: Found. Crystallogr. 50, 33 (1994).
2. M. Elfwing and E. Olson, J. Appl. Phys. 92, 5272 (2002).
3. P. Stadelmann, Ultramicroscopy 21, 131 (1987).
4. M. Y. Kim, J. M. Zuo, and J. C. H. Spence, Phys. Status Solidi A 166, 445 (1998).
5. P. Kruse, Ph.D. thesis, Universität Karlsruhe, 2004.
6. M. Schowalter, D. Lamoen, A. Rosenauer, P. Kruse, and D. Gerthsen, Appl. Phys. Lett. 85, 4938 (2004).
7. L. Reimer, Transmission Electron Microscopy, Springer Series in Optical Sciences (Springer, Berlin, 1984), Vol. 36, p. 56.
8. P. Kruse, A. Rosenauer, and D. Gerthsen, Ultramicroscopy 96, 11 (2003).
9. R. Kling, C. Kirchner, Th. Gruber, F. Reuss, and A. Waag, Nanotechnology 15, 1043 (2004).
10. M. Lehmann and H. Lichte, Microsc. Microanal. 8, 447 (2002).