Radiation resistance of electro-optic polymer-based modulators

Applied Physics Letters

Volumn 86, Issue 20, 2005, Pages 1-3

  Taylor, Edward W ^a   Nichter, James E ^b   Nash, Fazio D ^b   Haas, Franz ^b   Szep, Attila A ^b   Michalak, Richard J ^b   Flusche, Brian M ^b   Cook, Paul R ^b   McEwen, Tom A ^b   McKeon, Brian F ^b   Payson, Paul M ^b   Brost, George A ^b   Pirich, Andrew R ^b   Castaneda, Carlos ^c   Tsap, Boris ^d   Fetterman, Harold R ^d  

^a International Photonics Consultants   (United States)

^b AIR FORCE RESEARCH LABORATORY   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d Pacific Wave Industries   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS POLYCARBONATE (APC); ELECTRO-OPTICAL POLYMER MODULATORS; FREE VOLUME PROCESSES; RADIATION RESISTANCE;

CHROMOPHORES; CROSSLINKING; GAMMA RAYS; INSERTION LOSSES; IONIZATION; LIGHT MODULATORS; POLYCARBONATES; POLYELECTROLYTES;

ELECTROOPTICAL DEVICES;

EID: 20844450232     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1927713     Document Type: Article

References (17)

1. D. Chen, H. R. Fetterman, A. Chen, W. H. Steier, L. R. Dalton, W. Wang, and Y. Shi, Appl. Phys. Lett. 70, 3335 (1997).
2. M.-C. Oh, H. Zhang, C. Zhang, H. Erlig, Y. Chang, B. Tsap, D. Chang, A. Szep, W. H. Steier, H. R. Fetterman, and L. R. Dalton, IEEE J. Sel. Top. Quantum Electron. 7, 826 (2001).
3. C. Zhang, A. S. Ren, F. Wang, L. R. Dalton, S.-S. Lee, S. M. Garner, and W. H. Steier, Polym. Prepr. (Am. Chem. Soc. Div. Polym. Chem.) 40, 49 (1999).
4. C. Zhang, L. R. Dalton, M. C. Oh, H. Zhang, and W. H. Steier, Chem. Mater. 13, 3043 (2001).
5. Y. Shi, C. Zhang, J. H. Bechtel, L. R. Dalton, B. H. Robinson, and W. H. Steier, Science 288, 119 (2000).
6. E. W. Taylor, J. Nichter, F. Nash, R. Michalak, F. Haas, P. Payson, P. Cook, T. McEwen, B. McKeon, A. Szep, B. Flusche, A. Pirich, G. Brost, J. Grote, J. Zetts, P. Yaney, and E. Heckman, Proc. SPIE 5212, 216 (2003).
7. E. W. Taylor, Properties of Lithium Niobate and Other Novel Ferroelectric Materials, edited by, K. K. Wong, IEE EMIS DATAREVIEWS Series, No. 28, 359 (INSPEC, London, 2002).
8. J. F. Zigler, J. P. Biersack, and U. Littmark, The Stopping and Ion Range of Ions in Matter (Pergamon, New York, 1985).
9. C. M. Castaneda, 2001 IEEE Radiation Effects Data Workshop (NSREC), 77 (IEEE, New York, 2001).
10. U. A. Sevil, O. Guven, A. Kovacs, and I. Slezak, Radiat. Phys. Chem. 67, 575 (2003).
11. M. Eser and J. Furhmann, Nucl. Instrum. Methods Phys. Res. B 151, 118 (1999).
12. G.-M. Yang, S. Bauer-Gogonea, G. M. Sessler, S. Bauer, W. Ren, W. Wirges, and R. Gerhard-Multhaupth, Appl. Phys. Lett. 64, 22 (1994).
13. D. M. Ruck, J. Schulz, and N. Deusch, Nucl. Instrum. Methods Phys. Res. B 131, 149 (1997).
14. D. B. Ruck, Nucl. Instrum. Methods Phys. Res. B 166-167, 602 (2000).
15. D. Acerierno, F. LaMantia, and G. Titomanlio, Radiat. Phys. Chem. 16, 95 (1980).
16. D. C. McHerron and G. L. Wilkes, Polymer 34, 915 (1993).
17. F. Dehay, E. Balamzat, E. Ferain, and R. Legras, Nucl. Instrum. Methods Phys. Res. B 209, 103 (2003).