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Applied Physics Letters

Volumn 86, Issue 22, 2005, Pages 1-3

Stacking faults in Si nanocrystals

(3) Wang, Y Q a Smirani, R a Ross, G G a

a INRS EMT (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; HIGH RESOLUTION ELECTRON MICROSCOPY; LIGHT EMITTING DIODES; NANOSTRUCTURED MATERIALS; PASSIVATION; SILICA; STACKING FAULTS; THERMAL EFFECTS; THIN FILMS;

MICROSTRUCTURAL CHARACTERIZATION; NANOCRYSTALS; NANOTWINS; WHITE LINES;

SILICON;

EID: 20844443607 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1943501 Document Type: Article

Times cited : (29)

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