Time resolved study of laser diode characteristics during pulsed operation

Physica Status Solidi C: Conferences

Volumn , Issue 7, 2003, Pages 2283-2286

  Eichler, Christoph ^a   Schad, Sven Silvius ^a   Seyboth, Matthias ^a   Habel, Frank ^a   Scherer, Marcus ^a   Miller, Stephan ^b   Weimar, Andreas ^b   Lell, Alfred ^b   Härle, Volker ^b   Hofstetter, Daniel ^c  

^a UNIVERSITY OF ULM   (Germany)

^b OSRAM OPTO SEMICONDUCTORS GMBH   (Germany)

^c Universite de Neuchatel Institut de Physique   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

DIODE CHARACTERISTICS; ELECTRO-OPTICAL MEASUREMENTS; EMISSION WAVELENGTH; EXPERIMENTAL METHODS; GAN-BASED LASER DIODES; PULSED OPERATION; TEMPERATURE INCREASE; TIME RESOLVED STUDIES;

OPTICAL DATA PROCESSING;

NITRIDES;

EID: 20744460999     PISSN: 16101634     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1002/pssc.200303296     Document Type: Conference Paper

References (5)

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2. M. Röwe, P. Michler, J. Gutowski, S. Bader, G. Brüderl, V. Kümmler, S. Miller, A. Weimar, A. Lell, and V. Härle, phys. stat. sol. (a) 194, 414 (2002).
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5. W. Götz, N. M. Johnson, C. Chen, H. Liu, C. Kuo, and W. Imler, Appl. Phys. Lett. 68, 3144 (1996).