Scanning low-temperature element-specific magnetic microscopy

Review of Scientific Instruments

Volumn 76, Issue 6, 2005, Pages

  Cady, A ^a   Haskel, D ^a   Lang, J C ^a   Srajer, G ^a   Chupas, P ^b   Osborn, R ^b   Mitchell, J F ^b   Ahn, J S ^c   Hur, N ^c   Park, S ^c   Cheong, S W ^c  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c RUTGERS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MAGNETIC LOCAL BEHAVIOR; MAGNETIC MICROSCOPY; MANGANITES; PHOTON SOURCE;

CHARACTERIZATION; LOW TEMPERATURE EFFECTS; MAGNETIC DEVICES; MAGNETIC PROPERTIES; MANGANESE COMPOUNDS; PHOTONS;

MICROSCOPIC EXAMINATION;

EID: 20644441325     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1921510     Document Type: Article

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