Characterization of a microfocused circularly polarized x-ray probe

Review of Scientific Instruments

Volumn 71, Issue 6, 2000, Pages 2386-2390

  Pollmann, J ^a   Srajer, G ^a   Maser, J ^a   Lang, J C ^a   Nelson, C S ^a   Venkataraman, C T ^a   Isaacs, E D ^b  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001679791     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1150625     Document Type: Article

References (12)

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