Interface characterization in Pd-Fe-Al(oxide)-Fe systems using conversion electron mössbauer spectroscopy

Journal of Applied Physics

Volumn 97, Issue 11, 2005, Pages

  Schmitt, H ^a   Stahl, B ^a   Ghafari, M ^a   Hahn, H ^a  

^a DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BILAYERS; FERROMAGNETIC LAYERS; ISOMER SHIFT; NUCLEAR PROBE; TUNNELLING MAGNETORESISTANCE (TMR);

ALUMINUM; DEPOSITION; ELECTRON TUNNELING; ERROR ANALYSIS; MAGNETORESISTANCE; MOSSBAUER SPECTROSCOPY; SILICON; SUBSTRATES; SURFACE STRUCTURE; THIN FILMS;

IRON COMPOUNDS;

EID: 20544475207     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1924876     Document Type: Article

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