Effect of a cap layer on morphological stability of a strained epitaxial film

Journal of Applied Physics

Volumn 97, Issue 11, 2005, Pages

  Liu, Hai ^a   Huang, Rui ^a  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAP LAYER THICKNESS; CAP LAYERS; INTERFACE DIFFUSION; STRAINED EPITAXIAL FILMS;

BOUNDARY VALUE PROBLEMS; KINETIC THEORY; MORPHOLOGY; OXIDES; RESIDUAL STRESSES; SINGLE CRYSTALS; STRAIN; SURFACE ROUGHNESS;

EPITAXIAL GROWTH;

EID: 20544447106     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1928311     Document Type: Article

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