메뉴 건너뛰기




Volumn 25, Issue 12 SPEC. ISS., 2005, Pages 2799-2803

Selfconsistent electrical charging in insulators

Author keywords

Al2O3; Dielectric properties; Electrical properties; Insulators; SiO2

Indexed keywords

CHARGE TRANSFER; DIELECTRIC MATERIALS; ELECTRIC CHARGE; ELECTRON BEAMS; ELECTRON EMISSION; ELECTRON SCATTERING; IMPACT IONIZATION; MONTE CARLO METHODS; PHONONS; X RAY ANALYSIS;

EID: 20444500510     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2005.03.143     Document Type: Article
Times cited : (7)

References (11)
  • 7
    • 0000281080 scopus 로고    scopus 로고
    • Self-consistent electrical charging of insulating layers and metal-insulator-semiconductor structures
    • I.A. Glavatskikh V.S. Kortov and H.-J. Fitting Self-consistent electrical charging of insulating layers and metal-insulator-semiconductor structures J. Appl. Phys. 89 2001 440-448
    • (2001) J. Appl. Phys. , vol.89 , pp. 440-448
    • Glavatskikh, I.A.1    Kortov, V.S.2    Fitting, H.-J.3
  • 8
    • 0242335594 scopus 로고    scopus 로고
    • Secondary electron emission and self-consistent charge transport and storage in bulk insulators: Application to alumina
    • X. Meyza D. Goeuriot C. Guerret-Piécourt D. Tréheux and H.-J. Fitting Secondary electron emission and self-consistent charge transport and storage in bulk insulators: Application to alumina J. Appl. Phys. 94 2003 5384-5392
    • (2003) J. Appl. Phys. , vol.94 , pp. 5384-5392
    • Meyza, X.1    Goeuriot, D.2    Guerret-Piécourt, C.3    Tréheux, D.4    Fitting, H.-J.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.