Preparation and in situ characterization of surfaces using soft landing in a Fourier transform ion cyclotron resonance mass spectrometer

Analytical Chemistry

Volumn 77, Issue 11, 2005, Pages 3452-3460

  Alvarez, Jormarie ^a   Cooks, R Graham ^a   Barlow, S E ^b   Gaspar, Daniel J ^b   Futrell, Jean H ^b   Laskin, Julia ^b  

^a PURDUE UNIVERSITY   (United States)

^b PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRODEPOSITION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; IONIZATION; MONOLAYERS; SECONDARY ION MASS SPECTROMETRY; SELF ASSEMBLY; SURFACE CHEMISTRY;

ELECTROSPRAY IONIZATION; FLUORINATED SELF-ASSEMBLED MONOLAYER SURFACES (FSAM); FOURIER TRANSFORM ION CYCLOTRON RESONANCE MASS SPECTROMETERS; SOFT LANDING;

POLYPEPTIDES;

BRADYKININ; CESIUM ION; GRAMICIDIN S; PEPTIDE; SUBSTANCE P;

ARTICLE; ELECTROSPRAY; ENERGY; FILM; FOURIER TRANSFORMATION; INTERMETHOD COMPARISON; ION CYCLOTRON RESONANCE MASS SPECTROMETRY; IONIZATION; KINETICS; MASS SPECTROMETRY; MOLECULAR INTERACTION; PEPTIDE ANALYSIS; TIME OF FLIGHT MASS SPECTROMETRY;

EID: 20444371042     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac0481349     Document Type: Article

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