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Volumn 845, Issue , 2005, Pages 255-260

A novel pressure indicator for continuous flow PCR chip using micro molded PDMS pillar arrays

Author keywords

[No Author keywords available]

Indexed keywords

FUNCTIONS; MATHEMATICAL MODELS; MICROSTRUCTURE; POISSON RATIO; SILICON; THERMOSTATS;

EID: 20344391927     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (4)

References (7)
  • 1
    • 0032524099 scopus 로고    scopus 로고
    • Chemical amplification: Continuous-flow PCR on a chip
    • M. Kopp, A. de Mello, and A. Manz, Chemical amplification: Continuous-flow PCR on a chip. Science, 280(5366), 1046-1048, 1998.
    • (1998) Science , vol.280 , Issue.5366 , pp. 1046-1048
    • Kopp, M.1    De Mello, A.2    Manz, A.3
  • 2
    • 0033312151 scopus 로고    scopus 로고
    • A micromachined pressure/flow-sensor
    • R. Oosterbroek and et al., A micromachined pressure/flow-sensor. Sensors and Actuators A, 77(3), 167-177, 1999.
    • (1999) Sensors and Actuators A , vol.77 , Issue.3 , pp. 167-177
    • Oosterbroek, R.1
  • 4
    • 0027084127 scopus 로고
    • Pumping of water solutions in microfabricated electrohydrodynamic systems
    • Travemunde, Germany
    • O. Fuhr, R. Hagedorn, T. Muller, W. Benecke and B. Wager, Pumping of water solutions in microfabricated electrohydrodynamic systems Proc. MEMS 92, Travemunde, Germany, 25-30, 1992.
    • (1992) Proc. MEMS 92 , pp. 25-30
    • Fuhr, O.1    Hagedorn, R.2    Muller, T.3    Benecke, W.4    Wager, B.5
  • 5
    • 21644443104 scopus 로고    scopus 로고
    • Fabrication of three-dimensional SU-8 microstructures for MEMS applications
    • Anaheim, USA, in press
    • H. Yu, B. Li, Y. Zhao, and X. Zhang, Fabrication of three-dimensional SU-8 microstructures for MEMS applications, Proc. ASME 04, Anaheim, USA, in press, 2004.
    • (2004) Proc. ASME 04
    • Yu, H.1    Li, B.2    Zhao, Y.3    Zhang, X.4
  • 6
    • 0038038662 scopus 로고
    • McGraw-Hill, New York, NY
    • rd edn., McGraw-Hill, New York, NY, 1994.
    • (1994) rd Edn.
    • White, F.W.1
  • 7
    • 0025541504 scopus 로고
    • Verification of FEM analysis of load-deflection methods for measuring mechanical properties of thin films
    • Hilton Head, SC
    • J.Y. Pan, P. Un, F. Maseeh, and S. D. Senturia, Verification of FEM analysis of load-deflection methods for measuring mechanical properties of thin films, Tech. Dig. IEEE Solid-State Sensors and Actuator Workshop, Hilton Head, SC, 70-73, 1990.
    • (1990) Tech. Dig. IEEE Solid-State Sensors and Actuator Workshop , pp. 70-73
    • Pan, J.Y.1    Un, P.2    Maseeh, F.3    Senturia, S.D.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.