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Volumn 77, Issue 3, 1999, Pages 167-177

Micromachined pressure/flow-sensor

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL FLUID DYNAMICS; COMPUTER SIMULATION; FLOW MEASUREMENT; HYDRAULICS; MATHEMATICAL MODELS; PIEZOELECTRIC TRANSDUCERS; PRESSURE DROP; PRESSURE MEASUREMENT; THERMODYNAMIC STABILITY; VISCOSITY;

EID: 0033312151     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-4247(99)00188-0     Document Type: Article
Times cited : (99)

References (13)
  • 1
    • 0002382872 scopus 로고    scopus 로고
    • Micro Total Analysis Systems: Microfluidic aspects, integration concept and applications
    • in: A. Manz, H. Becker (Eds.), Springer, Berlin
    • A. van den Berg, T.S.J. Lammerink, Micro Total Analysis Systems: Microfluidic aspects, integration concept and applications, in: A. Manz, H. Becker (Eds.), Microsystem Technology in Chemistry and Life Science, Topics in Current Chemistry, Vol. 194, Springer, Berlin, 1998, pp. 21-49.
    • (1998) Microsystem Technology in Chemistry and Life Science, Topics in Current Chemistry , vol.194 , pp. 21-49
    • Van Den Berg, A.1    Lammerink, T.S.J.2
  • 8
    • 0029178740 scopus 로고
    • A Differential Pressure Liquid Flow Sensor for Flow Regulation and Dosing Systems
    • The Netherlands
    • M.A. Boillat, A.J. van der Wiel, A.C. Hoogerwerf, N.F. de Rooij, A Differential Pressure Liquid Flow Sensor for Flow Regulation and Dosing Systems, Proc. IEEE MEMS'95, The Netherlands, 1995 pp. 350-352.
    • (1995) Proc. IEEE MEMS'95 , pp. 350-352
    • Boillat, M.A.1    Van Der Wiel, A.J.2    Hoogerwerf, A.C.3    De Rooij, N.F.4
  • 10
    • 0025541504 scopus 로고
    • Verification of FEM analysis of load-deflection methods for measuring mechanical properties of thin films
    • J.Y. Pan, P. Lin, F. Maseeh, S.D. Senturia, Verification of FEM analysis of load-deflection methods for measuring mechanical properties of thin films, Tech. Digest IEEE Solid-State Sensors Workshop, 1990, pp. 70-73.
    • (1990) Tech. Digest IEEE Solid-State Sensors Workshop , pp. 70-73
    • Pan, J.Y.1    Lin, P.2    Maseeh, F.3    Senturia, S.D.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.