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Volumn 79, Issue 1-2, 2005, Pages 100-105
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Fabrication of nano-scale optical patterns in amorphous silicon carbide with focused ion beam writing
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Author keywords
Amorphous silicon carbide (a SiC:H); Focused ion beams; Nano scale optical data storage; Scanning near field optical microscopy (SNOM)
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Indexed keywords
ALUMINUM;
AMORPHOUS MATERIALS;
COATINGS;
DEPOSITION;
FABRICATION;
HYDROGENATION;
ION BEAMS;
NANOSTRUCTURED MATERIALS;
NEAR FIELD SCANNING OPTICAL MICROSCOPY;
THIN FILMS;
ACID VAPORS;
AMORPHOUS SILICON CARBIDE (A-SIC:H);
FOCUSED ION BEAMS;
NANOSCALE OPTICAL DATA STORAGE;
SCANNING NEAR FIELD OPTICAL MICROSCOPY (SNOM);
SILICON CARBIDE;
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EID: 20344376454
PISSN: 0042207X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.vacuum.2005.02.001 Document Type: Article |
Times cited : (19)
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References (18)
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