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Volumn 79, Issue 1-2, 2005, Pages 100-105

Fabrication of nano-scale optical patterns in amorphous silicon carbide with focused ion beam writing

Author keywords

Amorphous silicon carbide (a SiC:H); Focused ion beams; Nano scale optical data storage; Scanning near field optical microscopy (SNOM)

Indexed keywords

ALUMINUM; AMORPHOUS MATERIALS; COATINGS; DEPOSITION; FABRICATION; HYDROGENATION; ION BEAMS; NANOSTRUCTURED MATERIALS; NEAR FIELD SCANNING OPTICAL MICROSCOPY; THIN FILMS;

EID: 20344376454     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2005.02.001     Document Type: Article
Times cited : (19)

References (18)
  • 10
    • 20344371391 scopus 로고    scopus 로고
    • J. Singh S. Copley J. Mazumder ASM International Metals Park
    • T. Tsvetkova J. Singh S. Copley J. Mazumder Beam processing of advanced materials 1996 ASM International Metals Park 207
    • (1996) Beam Processing of Advanced Materials , pp. 207
    • Tsvetkova, T.1
  • 18
    • 20344407748 scopus 로고    scopus 로고
    • Tsvetkova T, Takahashi S, Zayats AV, Dawson P, Turner R, Bischoff L, Angelov O, Dimova-Malinovska D. Vacuum, to be published, doi:10.1016/j.vacuum. 2005.02.002
    • Tsvetkova T, Takahashi S, Zayats AV, Dawson P, Turner R, Bischoff L, Angelov O, Dimova-Malinovska D. Vacuum, to be published, doi:10.1016/j.vacuum. 2005.02.002.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.