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Volumn , Issue , 2004, Pages 284-286

Nanoscaled double Y-branch junction operating as room temperature RF to DC rectifier

Author keywords

2DEG; Ballistic; HF measurements; Nanotechnology; Nonlinear; Room temperature; Y branch junction

Indexed keywords

BALLISTICS; CAPACITANCE; CROSSTALK; ELECTRIC RECTIFIERS; ELECTRON BEAM LITHOGRAPHY; ELECTRONS; HALL EFFECT; NANOTECHNOLOGY; OPTIMIZATION; WAVEGUIDES;

EID: 20344365606     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (4)

References (7)
  • 2
    • 0000554931 scopus 로고
    • Analysis of an electron-wave y-branch switch
    • January
    • T. Palm and L. Thylén, "Analysis of an electron-wave y-branch switch," Applied Physics Letters, vol. 60, pp. 237-239, January 1992.
    • (1992) Applied Physics Letters , vol.60 , pp. 237-239
    • Palm, T.1    Thylén, L.2
  • 3
    • 0035927049 scopus 로고    scopus 로고
    • Investigation of switching effects between the drains of an electron y-branch switch
    • May
    • L. Worschech, B. Weidner, S. Reitzenstein, and A. Forchel, "Investigation of switching effects between the drains of an electron y-branch switch," Applied Physics Letters, vol. 78, no. 21, pp. 3325-3327, May 2001.
    • (2001) Applied Physics Letters , vol.78 , Issue.21 , pp. 3325-3327
    • Worschech, L.1    Weidner, B.2    Reitzenstein, S.3    Forchel, A.4
  • 4
    • 79956021220 scopus 로고    scopus 로고
    • Diode and transistor behaviors of three-terminal ballistic junctions
    • February
    • H. Q. Xu, "Diode and transistor behaviors of three-terminal ballistic junctions," Applied Physics Letters, vol. 80, no. 5, pp. 853-855, February 2002.
    • (2002) Applied Physics Letters , vol.80 , Issue.5 , pp. 853-855
    • Xu, H.Q.1
  • 7
    • 0035483623 scopus 로고    scopus 로고
    • A wide-band line-line dielectrometric method for liquids, soils, and planar substrates
    • October
    • I. Huynen, C. Steukers, and F. Duhamel, "A wide-band line-line dielectrometric method for liquids, soils, and planar substrates," IEEE Transactions on Instrumentation and Measurement, vol. 50, no. 5, pp. 1343-1348, October 2001.
    • (2001) IEEE Transactions on Instrumentation and Measurement , vol.50 , Issue.5 , pp. 1343-1348
    • Huynen, I.1    Steukers, C.2    Duhamel, F.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.