Electrical material property measurements using a free-field, ultra-wideband system

Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP

Volumn , Issue , 2004, Pages 174-177

  Grosvenor, C A ^a   Johnk, R ^a   Novotny, D ^a   Canales, S ^a   Baker Jarvis, J ^a   Janezic, M ^a   Drewniak, J ^b   Koledintseva, M ^b   Zhang, J ^b   Rawa, P ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b MISSOURI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL MATERIALS; MATERIAL PARAMETERS; MATERIAL PROPERTIES; ULTRA-WIDEBAND SYSTEMS;

DIELECTRIC PROPERTIES; GENETIC ALGORITHMS; HORN ANTENNAS; MEASUREMENTS; NONDESTRUCTIVE EXAMINATION; TIME DOMAIN ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

BROADBAND NETWORKS;

EID: 20244363527     PISSN: 00849162     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)

1. W.C. Stone, "MIST Construction Automation Report No. 3, "Electromagnetic Signal Attenuation in Construction Materials," Natl. Inst. Stand. Tech. Internal Report 6055, October 1997.
2. J. Baker-Jarvis, R.G. Geyer, J.H. Grosvenor, M.D. Janezic, C.A. Jones, B. Riddle, C.M. Weil, J. Krupka, "Dielectric characterization of low-loss materials: A comparison of techniques," IEEE Trans. Diel, and Electrical Insulation, Vol. 5, No. 4, August 1998, pp. 571-577.
3. E.J. Vanzura, J.R. Baker-Jarvis, J.H. Grosvenor, M.D. Janezic, "Intercomparison of permittivity measurements using the transmission/reflection method in 7-mm coaxial transmission lines," IEEE Trans. Microwave Theory and Techniques, Vol. 42, No. 11, Nov. 1994, pp. 2063 - 2070.
4. D.R. Novotny, R.T. Johnk, A. Ondrejka, "Analyzing broadband, free-field, absorber measurements" 2001 IEEE International Symposium on EMC, vol. 2, August 2001, pp. 1152-1157.
5. R.T. Johnk, A. Ondrejka, "Electrical material properties from a free-space time domain RF Absorber reflectivity measurement system," Proc. Int. IEEE EMC, Austin, TX, Aug. 1997, pp. 537-542.
6. R.T. Johnk, D.R. Novotny, C.M. Weil, M. Taylor, T.L. O'Hara, "Efficient and Accurate Testing of an EMC compliance chamber using an ultra-wideband measurement system," 2001 IEEE International Symposium on EMC, vol. 1, August 2001, pp.302-307.
7. C.A. Grosvenor, R. Johnk, D. Novotny, N. Canales, "TEM-horn antennas: A promising new technology for compliance testing," to be presented at the 2004 IEEE International Symposium on EMC, August 2004.
8. B. Riddle, J. Baker-Jarvis, J. Krupka, "Complex Permittivity Measurements of Common Plastics over Variable Temperatures IEEE Trans. MTT, Vol. 51, No. 3, March 2003.
9. John H. Holland, "Genetic Algorithms," Scientific American, July 1992. pp. 66-72.
10. J.Zhang, K.Hu, M.Y.Koledintseva, J.L.Drewniak, R.T.Johnk "Application of A Genetic Algorithm for Extracting Parameters of Dispersive Curves for a Planar Composite Layer," PIERS, Europe, May 2004.
11. J. Zhang, M. Koledintseva, G. Antonini, J. Drewniak, K. Rozanov, A. Orlandi, "Reconstruction of the parameters of the Debye and Lorentzian dispersive media using a genetic algorithm," Proc. IEEE EMC Symposium, Boston, vol. 2, August 2003, pp. 898-903.