Electrical material properties from a free-space time-domain RF absorber reflectivity measurement system

IEEE International Symposium on Electromagnetic Compatibility

Volumn , Issue , 1997, Pages 537-542

  Johnk, Robert T ^a   Ondrejka, Arthur ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; DIELECTRIC MATERIALS; ELECTROMAGNETIC WAVE ABSORPTION; ELECTROMAGNETIC WAVE SCATTERING; PERMITTIVITY; REFLECTOMETERS; TIME DOMAIN ANALYSIS;

EDGE EFFECT REMOVAL ALGORITHMS;

ELECTROMAGNETIC WAVE REFLECTION;

EID: 0031344311     PISSN: 01901494     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)