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Volumn 4, Issue 6, 2005, Pages 431-432
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Catching dopants in action
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Author keywords
[No Author keywords available]
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Indexed keywords
CALCIUM;
CRYSTAL ORIENTATION;
CRYSTAL STRUCTURE;
CRYSTALLINE MATERIALS;
CURRENT DENSITY;
DISLOCATIONS (CRYSTALS);
ELECTRIC CURRENTS;
ELECTRON ENERGY LOSS SPECTROSCOPY;
EPITAXIAL GROWTH;
GRAIN BOUNDARIES;
HIGH TEMPERATURE SUPERCONDUCTORS;
SUPERCONDUCTING FILMS;
TRANSMISSION ELECTRON MICROSCOPY;
YTTRIUM BARIUM COPPER OXIDES;
CHEMICAL COMPOSITIONS;
CURRENT-CARYING CAPACITY;
HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
SCHOTTKY-FIELD-EMITTER ELECTRON MICROSCOPES;
DOPING (ADDITIVES);
CALCIUM;
NANOMATERIAL;
CHEMISTRY;
CRYSTALLIZATION;
ELECTRIC CONDUCTIVITY;
ELECTRICITY;
METHODOLOGY;
NOTE;
TEMPERATURE;
ULTRASTRUCTURE;
CALCIUM;
CRYSTALLIZATION;
ELECTRIC CONDUCTIVITY;
ELECTRIC WIRING;
NANOSTRUCTURES;
TEMPERATURE;
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EID: 20144375225
PISSN: 14761122
EISSN: None
Source Type: Journal
DOI: 10.1038/nmat1399 Document Type: Short Survey |
Times cited : (5)
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References (10)
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