Investigation of artefact sources in synchrotron microtomography via virtual X-ray imaging

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 234, Issue 3, 2005, Pages 333-348

  Vidal, F P ^a,b   Letang J M ^b   Peix, G ^b   Cloetens, P ^c  

^a BANGOR UNIVERSITY   (United Kingdom)

^b UNIVERSITÉ DE LYON   (France)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

Artefact; Deterministic simulation (ray tracing); Modulation transfer function; Monte Carlo method; Phase contrast; X ray microtomography

Indexed keywords

CHEMICAL ANALYSIS; COMPUTER SIMULATION; COMPUTERIZED TOMOGRAPHY; FIBER REINFORCED MATERIALS; MONTE CARLO METHODS; OPTICAL TRANSFER FUNCTION; RAY TRACING; SYNCHROTRONS;

ARTEFACT; DETERMINISTIC SIMULATION (RAY TRACING); EUROPEAN SYNCHROTRON RADIATION FACILITY (ESRF); PHASE CONTRAST; SYNCHROTRON MICROTOMOGRAPHY; X-RAY MICROTOMOGRAPHY;

ELEMENTARY PARTICLE SOURCES;

EID: 19944379889     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2005.02.003     Document Type: Article

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