Enhancing the efficiency of bayesian network based Coverage Directed Test Generation

Proceedings - IEEE International High-Level Design Validation and Test Workshop, HLDVT

Volumn , Issue , 2004, Pages 75-80

  Braun, Markus ^a   Fine, Shai ^b   Ziv, Avi ^b  

^a STZ Softwaretechnik   (Germany)

^b IBM HAIFA RESEARCH LAB   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

BAYESIAN NETWORKS; COVERED DIRECT TEST GENERATION (CDG); DATA COLLECTION; DESIGN UNDER VERIFICATION (DUV);

ALGORITHMS; COMPUTER MONITORS; COMPUTER SIMULATION; DATA ACQUISITION; EFFICIENCY; FEEDBACK; HUMAN COMPUTER INTERACTION; MATHEMATICAL MODELS;

COMPUTER NETWORKS;

EID: 19944377197     PISSN: 15526674     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/HLDVT.2004.1431241     Document Type: Conference Paper

References (8)

1. M. Bose, J. Shin, E. M. Rudnick, T. Dukes, and M. Abadir. A Genetic Approach to Automatic Bias Generation for Biased Random Instruction Generation. In Proceedings of the 2001 Congress on Evolutionary Computation CEC2001, pages 442-448, May 2001.
2. M. Braun, W. Rosenstiel, and K.-D. Schubert. Comparison of Bayesian Networks and Data Mining for Coverage Directed Verification. In IEEE International High-Level Validation and Test Workshop (HLDVT 2003), pages 91-95. Omnipress, 2003.
3. S. Fine and A. Ziv. Coverage Directed Test Generation for Functional Verification using Bayesian Networks. In Proceedings of the 40th Design Automation Conference (DAC 2003), pages 286-291, New York, 2003. Association for Computing Machinery.
4. S. Fine and A. Ziv. Enhancing the Control and Efficiency of the Covering Process. In IEEE International High-Level Validation and Test Workshop (HLDVT2003), pages 96-101. Omnipress, 2003.
5. R. Grinwald, E. Harel, M. Orgad, S. Ur, and A. Ziv. User Defined Coverage: A Tool Supported Methodology for Design Verification. In Proceedings of the 35th Design Automation Conference (DAC 1998), pages 158-163, New York, 1998. Association for Computing Machinery.
6. T. Hastie, R. Tibshirani, and J. H. Friedman. The Elements of Statistical Learning. Springer, Berlin, July 2001.
7. G. Nativ, S. Mittermaier, S. Ur, and A. Ziv. Cost Evaluation of Coverage Directed Test Generation for the IBM Mainframe. In International Test Conference (ITC 2001), pages 793-802, Washington -Brussels - Tokyo, 2001. IEEE Computer Society Press.
8. J. Pearl. Probabilistic Reasoning in Intelligent Systems: Network of Plausible Inference. Morgan Kaufmann, 1988.