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Volumn 23, Issue 5, 2004, Pages
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Strain and relaxation of MBE-HgCdTe films
a a a a a a a a |
Author keywords
Cd1 yZnyTe substrate; FWHM; HgCdTe; Misfit dislocation; Reciprocal lattice mapping
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Indexed keywords
EPITAXIAL GROWTH;
INFRARED DETECTORS;
STRAIN;
STRESS RELAXATION;
X RAY DIFFRACTION;
CD1-YZNYTE SUBSTRATE;
HGCDTE;
MISFIT DISLOCATION;
RECIPROCAL LATTICE MAPPING;
THIN FILMS;
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EID: 19944376452
PISSN: 10019014
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (2)
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References (7)
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