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Volumn 545, Issue 3, 2005, Pages 721-726
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A novel application of a PIN diode-preamplifier set for the measurement of charged particles
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Author keywords
Charged particle spectroscopy; Low noise preamplifiers; PIN photodiodes
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Indexed keywords
AMPLIFIERS (ELECTRONIC);
BACKSCATTERING;
CAPACITANCE;
CURRENT DENSITY;
JUNCTION GATE FIELD EFFECT TRANSISTORS;
LEAKAGE CURRENTS;
PHOTODIODES;
SILICON;
SPECTROSCOPIC ANALYSIS;
SPURIOUS SIGNAL NOISE;
CHARGED PARTICLE SPECTROSCOPY;
LOW-NOISE PREAMPLIFIERS;
PIN DIODES;
SURFACE BARRIER DETECTORS;
CHARGED PARTICLES;
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EID: 19944373771
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nima.2005.02.017 Document Type: Article |
Times cited : (17)
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References (16)
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