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Volumn 545, Issue 3, 2005, Pages 721-726

A novel application of a PIN diode-preamplifier set for the measurement of charged particles

Author keywords

Charged particle spectroscopy; Low noise preamplifiers; PIN photodiodes

Indexed keywords

AMPLIFIERS (ELECTRONIC); BACKSCATTERING; CAPACITANCE; CURRENT DENSITY; JUNCTION GATE FIELD EFFECT TRANSISTORS; LEAKAGE CURRENTS; PHOTODIODES; SILICON; SPECTROSCOPIC ANALYSIS; SPURIOUS SIGNAL NOISE;

EID: 19944373771     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2005.02.017     Document Type: Article
Times cited : (17)

References (16)
  • 11
    • 19944369179 scopus 로고    scopus 로고
    • Carrollton, TX, USA
    • Optek Technology Inc., Optek's Product Catalog, Carrollton, TX, USA, 1997.
    • (1997) Optek's Product Catalog


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.