Structural, optical and electrical properties of ZnO films grown on c-plane sapphire and (1 0 0)γ-LiAlO2 by pulse laser deposition

Journal of Crystal Growth

Volumn 280, Issue 1-2, 2005, Pages 185-190

  Zou, Jun ^a,b   Zhou, Shengming ^a   Xia, Changtai ^a   Hang, Yin ^a   Xu, Jun ^a   Gu, Shulin ^c   Zhang, Rong ^c  

^a SHANGHAI INSTITUTE OF OPTICS AND FINE MECHANICS   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

^c NANJING UNIVERSITY   (China)

Author keywords

LiAlO2; Stress; Structural properties; ZnO film

Indexed keywords

DEPOSITION; ELECTROOPTICAL DEVICES; LASER PULSES; LITHIUM COMPOUNDS; PHOTOCONDUCTIVITY; POLYCRYSTALLINE MATERIALS; SAPPHIRE; STRESSES; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

Γ-LIALO2; ACOUSTOELECTRIC DEVICES; PULSED LASER DEPOSITION (PLD); STRUCTURAL PROPERTIES; ZNO FILMS;

ZINC OXIDE;

EID: 19944364875     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2005.03.036     Document Type: Article

References (11)

1. R.F. Service Science 276 1997 895
2. W.T. Lim, and C.H. Lee Thin Solid Films 353 1999 12
3. G.H. Lee Solid State Commun. 128 2003 351
4. K. Tabata, T. Choso, and Y. Nagasawa Surf. Sci. 408 1998 137
5. S. Fujihara, C. Sasaki, and T. Kimura J. Eur. Ceram. Soc. 21 2001 2109
6. P. Bonasewicz, W. Hirschwald, and G. Neumannn J. Electrochem. Soc. 133 1986 2207
7. G. Heiland, E. Mollwo, and F. Stockmann F. Seitz D. Turnbull Solid State Physics vol. 8 1959 Academic New York 191
8. D.C. Look, J.W. Hemsky, and J.R. Sizelove Phys. Rev. Lett. 82 1999 2552
9. A.F. Kohan, G. Geder, D. Morgan, and C.G. Van de Walle Phys. Rev. B 61 2000 15019
10. C.G. Van de Walle Phys. Rev. Lett. 85 2000 1012
11. Jun-Liang Zhao, Xiao-Min Li, Ji-Ming Bian, Wei-Dong Yu, and Xiang-Dong Gao J. Crystal Growth 276 2005 507