Worst-case tolerance design by genetic algorithms

IEEE International Symposium on Industrial Electronics

Volumn 4, Issue , 2002, Pages 1178-1183

  Spagnuolo, G ^a   Vitelli, M ^b  

^a UNIVERSITY OF SALERNO   (Italy)

^b SECOND UNIVERSITY OF NAPLES   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CELL PROLIFERATION; FITS AND TOLERANCES; GENETIC ALGORITHMS;

EVOLUTIONARY APPROACH; FEASIBLE REGIONS; FITNESS FUNCTIONS; OBJECTIVE FUNCTIONS; REPRODUCTION OPERATOR; TOLERANCE DESIGN; TOLERANCE REGIONS; WORST CASE TOLERANCES;

INDUSTRIAL ELECTRONICS;

EID: 19844382894     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/isie.2002.1025956     Document Type: Conference Paper

References (8)

1. R.Spence and R.S.Soin, Tolerance design of electronic circuits, Addison Wesley Publishing Company, 1988.
2. J.Wojciechowski and J.Vlach, "Ellipsoidal method for design centering and yield estimation", IEEE Trans. On CAD, Vol.12, No.10, Oct.1993, pp.1570-1579.
3. G.Spagnuolo: "An interval arithmetic-based yield evaluation in circuit tolerance design", Proc. of IEEE ISCAS 2002, Phoenix, U.S.A., June 2002.
4. Z.Michalewickz, Genetic Algorithms + Data Structures = Evolution Programs, Artificial Intelligence, Springer-Verlag, 1992.
5. N.Femia, P.Lamberti, V.Mainardi, G.Petrone, G.Spagnuolo: "Selection criteria of closed loop controllers for dc-dc voltage regulators based on nominal and tolerance, design: Genetic, algorithm and vertex analysis based optimization", Proc. of IEEE ISIE 2002, L'Aquila, Italy.
6. N.Femia, G.Spagnuolo and M.Vitelli: "Optimized tolerance design of feedback compensation networks for voltage regulators", Proc. of IEEE ISIE 2002, L'Aquila, Italy.
7. A.Seifi, K.Ponnambalam and J.Vlach, "A Unified Approach to Statistical Design Centering of Integrated Circuits with Correlated Parameters", IEEE Trans. On Circ. and Sys. I, Vol. 46, No. 1,Jan. 1999, pp. 190-196.
8. A.Wu, K.Y.Wu, R.M.M.Chen and Y.Shen, "Parallel optimal statistical design method with response surface modeling using genetic algorithm", IEE Proc. on Circ. Dev. Syst., Vol.145, No.1, Feb. 1998, pp.7-12.