Near field raman spectral measurement of monocrystalline silicon by apertureless SNOM in reflection geometry

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5635, Issue , 2005, Pages 292-296

  Wu, Xiaobin ^a   Wang, Yang ^a   Wang, Jia ^a   Tian, Qian ^a   Yu, Jianyuan ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

Apertureless SNOM; Near field optics; Near field Raman spectroscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTALLINE MATERIALS; DIAPHRAGMS; FIBER OPTICS; GEOMETRICAL OPTICS; RAMAN SCATTERING; SIGNAL TO NOISE RATIO; SILICON; SURFACES;

APERTURELESS SNOM; NEAR FIELD OPTICS; NEAR FIELD RAMAN SPECTROSCOPY; REFLECTION GEOMETRY;

OPTICAL MICROSCOPY;

EID: 19844379616     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.571128     Document Type: Conference Paper

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