Exponential sensitivity to dephasing of electrical conduction through a quantum dot

Physical Review Letters

Volumn 93, Issue 18, 2004, Pages

  Tworzydlo J ^a,b   Tajic, A ^a   Schomerus, H ^c   Brouwer, P W ^d   Beenakker, C W J ^a  

^a UNIVERSITEIT LEIDEN   (Netherlands)

^b UNIVERSITY OF WARSAW   (Poland)

^c MAX PLANCK INSTITUT FÜR PHYSIK KOMPLEXER SYSTEME   (Germany)

^d Laboratory of Atomic and Solid State Physics and Sibley School of Mechanical and Aerospace Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHAOS THEORY; COMPUTER SIMULATION; ELECTRIC CONDUCTANCE; MAGNETIC FIELDS; OSCILLATIONS; RANDOM PROCESSES; SENSITIVITY ANALYSIS; TRAJECTORIES;

DEPHASING; RANDOM MATRIX THEORY; UNIVERSAL CONDUCTANCE FLUCTUATIONS (UCF); WEAK LOCALIZATION (WL);

SEMICONDUCTOR QUANTUM DOTS;

EID: 19744379366     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.93.186806     Document Type: Article

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