Polarized X-ray absorption spectroscopy and XPS of TiS3: S K- and Ti L-edge XANES and S and Ti 2p XPS

Surface Science

Volumn 584, Issue 2-3, 2005, Pages 133-145

  Fleet, M E ^a   Harmer, S L ^a   Liu, X ^a   Nesbitt, H W ^a  

^a UNIVERSITY OF WESTERN ONTARIO   (Canada)

Author keywords

Layered structures; Sulfides; TiS3; X ray absorption near edge spectroscopy; X ray photoelectron spectroscopy

Indexed keywords

ABSORPTION SPECTROSCOPY; ANISOTROPY; CRYSTAL STRUCTURE; PHASE TRANSITIONS; POLARIZATION; SULFIDE MINERALS; VAN DER WAALS FORCES; X RAY PHOTOELECTRON SPECTROSCOPY; X RAY SPECTROSCOPY;

LAYERED STRUCTURES; SULFIDES; TIS3; X-RAY ABSORPTION NEAR EDGE SPECTROSCOPY (XANES);

TITANIUM COMPOUNDS;

EID: 19744375841     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2005.03.048     Document Type: Article

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