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Volumn 31, Issue 3, 2005, Pages 32-39

Solderability of electroless deposited Ni-P coatings with Sn-3.8Ag-0.7Cu and Sn-3.5Ag lead-free solder alloys

Author keywords

Alloys; Coating processes; Soldering

Indexed keywords

ATOMIC FORCE MICROSCOPY; COATINGS; ELECTROLESS PLATING; METALLIZING; MICROSTRUCTURE; NICKEL; OXIDATION; SCANNING ELECTRON MICROSCOPY; SOLDERING ALLOYS; SURFACE ROUGHNESS; TIN ALLOYS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 19444380388     PISSN: 03056120     EISSN: None     Source Type: Journal    
DOI: 10.1108/03056120510585054     Document Type: Article
Times cited : (6)

References (15)
  • 1
    • 2942537972 scopus 로고
    • "Factors influencing solderability of electroless Ni-P deposits"
    • Fang, J.L., Ye, X.R. and Fang, J. (1992), "Factors influencing solderability of electroless Ni-P deposits", Plating and Surface Finishing, Vol. 79 No. 7, pp. 44-6.
    • (1992) Plating and Surface Finishing , vol.79 , Issue.7 , pp. 44-46
    • Fang, J.L.1    Ye, X.R.2    Fang, J.3
  • 3
    • 0032614004 scopus 로고    scopus 로고
    • "Solder reaction-assisted crystallization of electroless Ni-P under bump metallization in low cost flip chip technology"
    • Jang, J.K., Kim, P.G. and Tu, K.U. (1999), "Solder reaction-assisted crystallization of electroless Ni-P under bump metallization in low cost flip chip technology", Journal of Applied Physics, Vol. 85 No. 12, pp. 8456-63.
    • (1999) Journal of Applied Physics , vol.85 , Issue.12 , pp. 8456-8463
    • Jang, J.K.1    Kim, P.G.2    Tu, K.U.3
  • 6
    • 0034829984 scopus 로고    scopus 로고
    • "Microstructure, joint strength and failure mechanism of Sn-Ag, Sn-Ag-Cu versus Sn-Pb-Ag solders in BGA packages"
    • paper presented at the 51st Electronic Components & Technology Conference, New York, NY
    • Lee, K.Y., Li. M., Olsen, D.R., Chen, W.T., Tan, B.T.C. and Mhaisalkar, S. (2001),"Microstructure, joint strength and failure mechanism of Sn-Ag, Sn-Ag-Cu versus Sn-Pb-Ag solders in BGA packages", paper presented at the 51st Electronic Components & Technology Conference, New York, NY, pp. 478-85.
    • (2001) , pp. 478-485
    • Lee, K.Y.1    Li, M.2    Olsen, D.R.3    Chen, W.T.4    Tan, B.T.C.5    Mhaisalkar, S.6
  • 7
    • 0034270284 scopus 로고    scopus 로고
    • "Under bump metallisation of fine pitch flip-chip using electroless nickel deposition"
    • Liu, C., Hutt, D.A., Whalley, D.C. and Conway, P.P. (2000), "Under bump metallisation of fine pitch flip-chip using electroless nickel deposition", Journal of Electronics Manufacturing, Vol. 10 No. 3, pp. 161-70.
    • (2000) Journal of Electronics Manufacturing , vol.10 , Issue.3 , pp. 161-170
    • Liu, C.1    Hutt, D.A.2    Whalley, D.C.3    Conway, P.P.4
  • 8
    • 0028482091 scopus 로고
    • "Solderability of electroless nickel alloys using wetting balance technique"
    • Lee, C.Y. and Lin, K.L. (1994), "Solderability of electroless nickel alloys using wetting balance technique", Japanese Journal of Applied Physics, Vol. 33, pp. 4708-13.
    • (1994) Japanese Journal of Applied Physics , vol.33 , pp. 4708-4713
    • Lee, C.Y.1    Lin, K.L.2
  • 9
    • 0036349869 scopus 로고    scopus 로고
    • "Interlaminar and ductile characteristics of carbon fibers-reinforced plastics produced by nanoscaled electroless nickel plating on carbon fiber surfaces"
    • Park, S.J., Jang, Y.S. and Rhee, K.Y. (2002), "Interlaminar and ductile characteristics of carbon fibers-reinforced plastics produced by nanoscaled electroless nickel plating on carbon fiber surfaces", Journal of Colloid and Interface Science, Vol. 245, pp. 383-90.
    • (2002) Journal of Colloid and Interface Science , vol.245 , pp. 383-390
    • Park, S.J.1    Jang, Y.S.2    Rhee, K.Y.3
  • 10
    • 0035450978 scopus 로고    scopus 로고
    • "Properties of electroless and electroplated Ni-P and its application in microgalvanics"
    • Peeters, P., Hoorn, G.V.D., Daenen, T., Kurowski, A. and Staikov, G. (2001), "Properties of electroless and electroplated Ni-P and its application in microgalvanics", Electrochimica Acta, Vol. 47, pp. 161-9.
    • (2001) Electrochimica Acta , vol.47 , pp. 161-169
    • Peeters, P.1    Hoorn, G.V.D.2    Daenen, T.3    Kurowski, A.4    Staikov, G.5
  • 12
    • 0031636970 scopus 로고    scopus 로고
    • "Reliability and process characterization of electroless nickel-gold/solder flip chip interconnect technology"
    • paper presented at the 48th Electronic Components and Technology Conference
    • Wiegele, S., Thompson, P., Lee, R. and Ramsland, E. (1998), "Reliability and process characterization of electroless nickel-gold/ solder flip chip interconnect technology", paper presented at the 48th Electronic Components and Technology Conference, pp. 861-6.
    • (1998) , pp. 861-866
    • Wiegele, S.1    Thompson, P.2    Lee, R.3    Ramsland, E.4
  • 13
    • 0035332994 scopus 로고    scopus 로고
    • "Wettability of electroless Ni in the under bump metallurgy with lead free solder"
    • Young, B.L., Duh, J.G. and Chiou, B.S. (2001), "Wettability of electroless Ni in the under bump metallurgy with lead free solder", Journal of Electronics Materials, Vol. 30 No. 5, pp. 543-53.
    • (2001) Journal of Electronics Materials , vol.30 , Issue.5 , pp. 543-553
    • Young, B.L.1    Duh, J.G.2    Chiou, B.S.3
  • 14
    • 0037076832 scopus 로고    scopus 로고
    • "Six cases of reliability study of Pb-free solder joints in electronic packaging technology"
    • Zeng, K. and Tu. K.N. (2002), "Six cases of reliability study of Pb-free solder joints in electronic packaging technology", Materials Science and Engineering R, Vol. 38, pp. 55-105.
    • (2002) Materials Science and Engineering R , vol.38 , pp. 55-105
    • Zeng, K.1    Tu, K.N.2
  • 15
    • 2942560470 scopus 로고    scopus 로고
    • "Characterization of nickel phosphorus surface by ToF-SIMS"
    • Zhang, B.C., Barth, G., Liu, H.K. and Chang, S. (2004), "Characterization of nickel phosphorus surface by ToF-SIMS", Applied Surface Science, Vol. 231 No. 2, pp. 868-73.
    • (2004) Applied Surface Science , vol.231 , Issue.2 , pp. 868-873
    • Zhang, B.C.1    Barth, G.2    Liu, H.K.3    Chang, S.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.