Automatic Damage Test Benches: From Samples to Large-Aperture Optical Components

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5252, Issue , 2004, Pages 412-422

  Loiseau, Marc ^a   Lamaignère, Laurent ^a   Courchinoux, Roger ^a   Razé, Gérard ^a   Sudre, Caroline ^a   Josse, Michel ^a   Donval, Thierry ^a   Bercegol, Hervé ^a  

^a CEA CESTA   (France)

Author keywords

Component lifetime; Damage density; Damage growth; UV laser damage

Indexed keywords

APPROXIMATION THEORY; COMPUTATIONAL METHODS; GRAPH THEORY; HIGH POWER LASERS; LASER DAMAGE; PARAMETER ESTIMATION; SAMPLING; STATISTICAL METHODS;

COMPONENT LIFETIME; DAMAGE DENSITY; DAMAGE GROWTH; UV LASER DAMAGE;

OPTICAL SYSTEMS;

EID: 1942510406     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.512939     Document Type: Conference Paper

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