Modeling the Effects of Proton Damage to CCDs on Astrometric Measurement Precision

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5167, Issue , 2004, Pages 302-312

  Dorland, Bryan N ^a  

^a US NAVAL OBSERVATORY   (United States)

Author keywords

Astrometry; Charge Bar Injection; Charge Coupled Device (CCD); Charge Transfer Efficiency (CTE); Charge Transfer Inefficiency (CTI); Displacement Damage; Fat Zero; Protons; Radiation Damage; Radiation Damage Mitigation Techniques; Simulations; Traps

Indexed keywords

ASTROMETRY; CHARGE BAR INJECTION; CHARGE TRANSFER EFFICIENCY (CTE); CHARGE TRANSFER INEFFICIENCY (CTI); DISPLACEMENT DAMAGE; FAT ZERO; RADIATION DAMAGE MITIGATION TECHNIQUES; SIMULATIONS; TRAPS;

ASTROPHYSICS; CHARGE TRANSFER; COMPUTER SIMULATION; DELAY CIRCUITS; MATHEMATICAL MODELS; PHOTOMULTIPLIERS; RADIATION BELTS; RADIATION DAMAGE; SIGNAL TO NOISE RATIO; SPACE RESEARCH;

CHARGE COUPLED DEVICES;

EID: 1942454421     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.508590     Document Type: Conference Paper

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