Fluorenone Defects in Polyfluorene-based Light-emitting Diodes: Emission Properties and Device Performance

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5214, Issue , 2004, Pages 207-215

  Jaiser, F ^a   Yang, X H ^a   Neher, D ^a   Guntner R ^b   Scanduicci De Freitas, P ^b   Forster, M ^b   Scherf, U ^b  

^a UNIVERSITY OF POTSDAM   (Germany)

^b UNIVERSITY OF WUPPERTAL   (Germany)

Author keywords

Charge carrier trapping; Ketonic defects; Light emitting diodes; Multilayer devices; Polyfluorene

Indexed keywords

CHARGE CARRIERS; ELECTROLUMINESCENCE; IONIZATION; KETONES; MULTILAYERS; PHOTOOXIDATION; POLARIZATION; POLYMERIZATION; POLYMERS; ULTRAVIOLET RADIATION;

CHARGE CARRIER TRAPPING; KETONIC DEFECTS; POLYFLUORENE;

LIGHT EMITTING DIODES;

EID: 1942421341     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.505209     Document Type: Conference Paper

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