Quantitative solid sample analysis by ArF excimer laser ablation

Journal of Molecular Structure

Volumn 744-747, Issue SPEC. ISS., 2005, Pages 255-258

  Delmdahl, Ralph ^a   Von Oldershausen, Georg ^a  

^a Lambda Physik GmbH   (Germany)

Author keywords

Ablation; ArF excimer laser; LA ICP MS; Quality control; Solid sample analysis

Indexed keywords

AEROSOLS; COMPOSITION; EXCIMER LASERS; FLUORINE COMPOUNDS; FRACTIONATION; INDUCTIVELY COUPLED PLASMA; INERT GASES; LASER ABLATION; MASS SPECTROMETRY; MICROWAVES; PHOTONS; STOICHIOMETRY;

ELEMENTAL ANALYSIS; MICROWAVE-INDUCED PLASMAS; PHOTON ENERGY; STOICHIOMETRIC COMPOSITION;

CHEMICAL ANALYSIS;

EID: 19344368505     PISSN: 00222860     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.molstruc.2004.11.038     Document Type: Conference Paper

References (5)

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3. P.M. Outridge, W. Doherty, and D.C. Gregoire The formation of trace element-enriched particulates during laser ablation of refractory materials Spectrochimica Acta Part B 51 1996 1451 1462
4. D. Günther, and C.A. Heinrich Comparison of the ablation behaviour of 266 nm Nd:YAG and 193 nm ArF excimer lasers for LA-ICP-MS analysis Journal of Analytical Atomic Spectrometry 14 1999 1369 1374
5. 2O loss from fluid inclusion in natural quartz crystals Contributions to Mineralogy and Petrology 137 1999 1 14