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Volumn 169-170, Issue , 2003, Pages 639-642

Refractive index control and etching of C-S-Au film by plasma processes

Author keywords

C S Au film; Electronic polarizability; O2 plasma etching; Refractive index; RF plasma CVD; Sputtering

Indexed keywords

AMORPHOUS MATERIALS; ELECTRODES; OPTICAL WAVEGUIDES; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; REFRACTIVE INDEX;

EID: 19244383783     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(03)00091-4     Document Type: Article
Times cited : (2)

References (13)
  • 10
    • 0010211231 scopus 로고
    • Y. Inuishi, T. Nakajima, K. Kawabe, and M. Ieda Tokyo: Ohm Tokyo Chapter 2, in Japanese
    • Nakajima T. Inuishi Y. Nakajima T. Kawabe K. Ieda M. Yudentai-genshoron 1973 Ohm Tokyo Chapter 2, in Japanese
    • (1973) Yudentai-genshoron
    • Nakajima, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.