Scanning probe energy loss spectroscopy below 50 nm resolution

Applied Physics Letters

Volumn 85, Issue 21, 2004, Pages 5034-5036

  Festy, F ^a   Palmer, R E ^a  

^a UNIVERSITY OF BIRMINGHAM   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON SCATTERING; ELECTRON SOURCES; ENERGY DISSIPATION; SCANNING TUNNELING MICROSCOPY; SILICON; SPECTROSCOPIC ANALYSIS; ULTRAHIGH VACUUM;

ENERGY LOSS SPECTRUM; FIELD EMISSION MODE; INELASTICALLY SCATTERED; SCANNING PROBE ENERGY LOSS SPECTROSCOPY (SPELS);

SURFACE ROUGHNESS;

EID: 19144362141     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1818742     Document Type: Article

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