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Volumn 27, Issue 3, 2002, Pages 393-398

Shot-noise statistics in diffusive conductors

Author keywords

71.10.Fd Lattice fermion models; 72.70.+m Noise processes and phenomena; 73 Electronic structure and electrical properties of surfaces; And low dimensional structures; Interfaces; Thin films

Indexed keywords


EID: 19044362110     PISSN: 14346028     EISSN: None     Source Type: Journal    
DOI: 10.1140/epjb/e2002-00170-5     Document Type: Article
Times cited : (12)

References (41)
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    • note
    • On a 64 bit processor, if the chain is represented by N=28 bits allocated in the middle of the 64 bits word, that leaves 18 unused bits on each side. Those bits can be used as buffers, to differ and speed up the counting of transmitted and reflected charges, every 18 time steps. This very 18 number explains the somehow odd measurement durations Δ that are chosen in our computation
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    • note
    • 3), which allows to significantly decrease the effect of the voltmeters' voltage noise. For high resistance conductor, a similar trick could decrease the nuisance from the current noise of the detectors. Note also that this multi-detectors technique can be generalized for higher moments
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    • note
    • s is the cut-off frequency of the set-up
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.