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Thin Solid Films

Volumn 361, Issue , 2000, Pages 360-363

Self-limitation of Na content at the CdS/Cu(In,Ga)Se2 solar cell heterojunction

(16) Heske, C a,b Eich, D a Groh, U a Fink, R a Umbach, E a Van Buuren, T c Bostedt, C c Franco, N c Terminello, L J c Grush, M M d Callcott, T A d Himpsel, F J e Ederer, D L f Perera, R C C b Riedl, W g Karg, F h

a UNIVERSITY OF WÜRZBURG (Germany)

b LAWRENCE BERKELEY NATIONAL LABORATORY (United States)

c LAWRENCE LIVERMORE NATIONAL LABORATORY (United States)

d UNIVERSITY OF TENNESSEE (United States)

e Wisconsin Electric Machines and Power Electronics Consortium (United States)

f TULANE UNIVERSITY (United States)

g SIEMENS AG (Germany)

h SHELL GLOBAL SOLUTIONS INTERNATIONAL B V (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER COMPOUNDS; ELECTRONIC STRUCTURE; HETEROJUNCTIONS; IMPURITIES; PHOTOELECTRON SPECTROSCOPY; SODIUM; THIN FILM DEVICES; X RAY SPECTROSCOPY;

BURIED HETEROJUNCTIONS; IMPURITY LOCALIZATION;

CADMIUM SULFIDE SOLAR CELLS;

EID: 18844462908 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(99)00769-5 Document Type: Article

Times cited : (12)

References (10)

1
- 0032472117
- Kronik L., Cahen D., Schock H.-W. Adv. Mater. 10:1998;31.
- (1998) Adv. Mater. , vol.10 , pp. 31
- Kronik, L.¹ Cahen, D.² Schock, H.-W.³

2
- 0030411053
- Probst V., Karg F., Rimmasch J., Riedl W., Stetter W., Harms H., Eibl O. Proc. MRS Spring Meet. Symp. 426. 1996;165.
- (1996) Proc. MRS Spring Meet. Symp. 426 , pp. 165
- Probst, V.¹ Karg, F.² Rimmasch, J.³ Riedl, W.⁴ Stetter, W.⁵ Harms, H.⁶ Eibl, O.⁷

3
- 0031272241
- Niles D.W., Ramanathan K., Hasoon F., Noufi R., Tielsch B.J., Fulghum J.E. J. Vac. Sci. Technol. A. 15:1997;3044.
- (1997) J. Vac. Sci. Technol. a , vol.15 , pp. 3044
- Niles, D.W.¹ Ramanathan, K.² Hasoon, F.³ Noufi, R.⁴ Tielsch, B.J.⁵ Fulghum, J.E.⁶

4
- 0000865994
- and references therein
- S.-H. Wei, S.B. Zhang, A. Zunger, J. Appl. Phys. 85 (1999) 7214, and references therein.
- (1999) J. Appl. Phys. , vol.85 , pp. 7214
- Wei, S.-H.¹ Zhang, S.B.² Zunger, A.³

5
- 0030165170
- Heske C., Fink R., Umbach E., Riedl W., Karg F. Appl. Phys. Lett. 68:1996;3431.
- (1996) Appl. Phys. Lett. , vol.68 , pp. 3431
- Heske, C.¹ Fink, R.² Umbach, E.³ Riedl, W.⁴ Karg, F.⁵

6
- 0012164547
- Heske C., Eich D., Fink R., et al. Appl. Phys. Lett. 75:1999;2082.
- (1999) Appl. Phys. Lett. , vol.75 , pp. 2082
- Heske, C.¹ Eich, D.² Fink, R.³

7
- 0001534708
- Heske C., Eich D., Fink R., et al. Appl. Phys. Lett. 74:1999;1451.
- (1999) Appl. Phys. Lett. , vol.74 , pp. 1451
- Heske, C.¹ Eich, D.² Fink, R.³

8
- 0018470606
- Eastman D.E., Donelon J.J., Hien N.C., Himpsel F.J. Nucl. Instrum. Methods. 172:1980;327.
- (1980) Nucl. Instrum. Methods , vol.172 , pp. 327
- Eastman, D.E.¹ Donelon, J.J.² Hien, N.C.³ Himpsel, F.J.⁴

9
- 0042601045
- Himpsel F.J. Braz. Phys. 23:1993;31.
- (1993) Braz. Phys , vol.23 , pp. 31
- Himpsel, F.J.¹

10
- 0029247488
- Jia J.J., Callcott T.A., Yurkas J., et al. Rev. Sci. Instrum. 66:1995;1394.
- (1995) Rev. Sci. Instrum. , vol.66 , pp. 1394
- Jia, J.J.¹ Callcott, T.A.² Yurkas, J.³

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