Advanced stacked elemental layer process for Cu(InGa)Se2 thin film photovoltaic devices

Materials Research Society Symposium - Proceedings

Volumn 426, Issue , 1996, Pages 165-176

  Probst, V ^a   Karg, F ^a   Rimmasch, J ^a   Riedl, W ^a   Stetter, W ^a   Harms, H ^a   Eibl, O ^a  

^a SIEMENS AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION EFFECTS; CRYSTAL IMPURITIES; ELECTRON DIFFRACTION; PHOTOVOLTAIC CELLS; SCANNING ELECTRON MICROSCOPY; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTING GLASS; SODIUM COMPOUNDS; THIN FILM DEVICES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

BARRIER COATINGS; STACKED ELEMENTAL LAYER PROCESS;

SOLAR CELLS;

EID: 0030411053     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-426-165     Document Type: Conference Paper

References (15)