Performance, energy, and reliability tradeoffs in replicating hot cache lines

CASES 2003: International Conference on Compilers, Architecture, and Synthesis for Embedded Systems

Volumn , Issue , 2003, Pages 309-317

  Zhang, W ^a   Kandemir, M ^a   Sivasubramaniam, A ^a   Irwin, M J ^a  

^a The Pennsylvania State University   (United States)

Author keywords

Cache Memories; Cache Reliability; Leakage Power; Line Replication

Indexed keywords

COMPUTER ARCHITECTURE; ELECTRIC POWER UTILIZATION; ENERGY EFFICIENCY; LEAKAGE CURRENTS; OPTIMIZATION; PERFORMANCE;

CACHE RELIABILITY; DATA CACHE; LEAKAGE ENERGIES; LINE REPLICATION;

BUFFER STORAGE;

EID: 18844451753     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/951746.951750     Document Type: Conference Paper

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