Buried linear extrinsic defects in colloidal photonic crystals

Advanced Materials

Volumn 17, Issue 10, 2005, Pages 1269-1272

  Vekris, Evangellos ^a   Kitaev, Vladimir ^a,b   Von Freymann, Georg ^a,c   Perovic, Doug D ^a   Aitchison, J Stewart ^a   Ozin, Geoffrey A ^a  

^a UNIVERSITY OF TORONTO   (Canada)

^b WILFRID LAURIER UNIVERSITY   (Canada)

^c KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CRYSTAL DEFECTS; PHOTOLITHOGRAPHY; PHOTORESISTORS; SCANNING ELECTRON MICROSCOPY; SELF ASSEMBLY; SILICA; SINGLE CRYSTALS; THIN FILMS;

HIGH-REFRACTIVE-INDEX MATERIALS; LINEAR EXTRINSIC DEFECTS; PHOTOMASK; PHOTONIC CRYSTALS (PC);

PHOTONS;

EID: 18844446934     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/adma.200401764     Document Type: Article

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