A general chemical conversion method to various semiconductor hollow structures

Small

Volumn 1, Issue 2, 2005, Pages 216-221

  Peng, Qing ^b   Xu, Sheng ^b   Zhuang, Zhongbin ^b   Wang, Xun ^b   Li, Yadong ^a  

^a TSINGHUA UNIVERSITY   (China)

^b NONE

Author keywords

Chalcogenides; Microspheres; Nanostructured materials; Selenides; Semiconductors

Indexed keywords

CHEMICAL ANALYSIS; DIFFRACTOMETERS; NANOSTRUCTURED MATERIALS; SILVER COMPOUNDS; X RAY POWDER DIFFRACTION; ZINC COMPOUNDS;

CHALCOGENIDES; MICROSPHERES; SELENIDES; SEMICONDUCTOR HOLLOW STRUCTURES;

SEMICONDUCTOR MATERIALS;

MICROSPHERE; OXIDE; POLYSTYRENE DERIVATIVE; SELENIUM;

ARTICLE; CHEMICAL MODEL; CHEMISTRY; CRYSTALLIZATION; ELECTROCHEMISTRY; INSTRUMENTATION; KINETICS; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR; SPECTROFLUOROMETRY; TEMPERATURE; X RAY DIFFRACTION;

CRYSTALLIZATION; ELECTROCHEMISTRY; KINETICS; MATERIALS TESTING; MICROSCOPY, ELECTRON, SCANNING; MICROSPHERES; MODELS, CHEMICAL; NANOTECHNOLOGY; OXIDES; POLYSTYRENES; SELENIUM; SEMICONDUCTORS; SPECTROMETRY, FLUORESCENCE; TEMPERATURE; X-RAY DIFFRACTION;

EID: 18844417701     PISSN: 16136810     EISSN: 16136829     Source Type: Journal    
DOI: 10.1002/smll.200400043     Document Type: Article

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